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SDV's X-ray Machine Achieves Remarkable Breakthrough in Insect Damage Detection for White Kidney Beans

SDV's X-ray Machine Achieves Remarkable Breakthrough in Insect Damage Detection for White Kidney Beans

June 18, 2025

At a major legume processing plant in Dalian, SDV's next-generation X-ray detector is scanning white kidney beans at 6,000 beans/minute. Confronting the industry's persistent challenge of insect borehole detection—where a mere 0.5% infestation rate can downgrade entire batches—the client had tested equipment from multiple countries without success.

SDV's breakthrough hinges on three core technologies:
1️⃣ Multi-spectral Imaging: 140kV micro-focus X-ray sources detect boreholes as small as 0.3mm²
2️⃣ Deep Learning AI: Neural networks trained on 100,000+ infestation samples reduce false positives to <0.02%
3️⃣ Dual-angle Scanning: Simultaneous top/bottom imaging eliminates blind zones

"Traditional color sorters fail with internal damage," stated the client's production director during acceptance testing. "SDV's solution not only achieves 99.8% defect removal but also increases premium bean yield by 15% through intelligent grading."

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